MOSFET – Page 4 – TechConnect Briefs

Modeling of Floating-Body Devices Based on Complete Potential Description

Sadachika N., Murakami T., Ando M., Ishimura K., Ohyama K., Miyake M., Mattausch H.J., Miura-Mattausch M., Miura-Mattausch M., Hiroshima University, JP

Advanced MOSFETs exploit the carrier confinement to suppress the short-channel effect, which is realized by reducing the bulk layer thickness. The ongoing developments of the multi-gate MOSFET as well as the fully-depleted SOI-MOSFET with ultra [...]

New Properties and New Challenges in MOS Compact Modeling

Zhou X., See G.H., Zhu G., Zhu Z., Zhu G., Zhu Z., Lin S., Wei C., Srinivas A., Zhang J., Nanyang Technological University, SG

As bulk-MOS technology is approaching its fundamental limit, non-classical devices such as multiple-gate (MG) and silicon-nanowire (SiNW) transistors emerge as promising candidates for future generation device building blocks. This trend poses new challenges in developing [...]

Transition Point Consideration for Velocity Saturating Four-terminal DG MOSFET Compact Model

Nakagawa T., Sekigawa T., Tsutsumi T., Hioki M., O’uchi S., Koike H., AIST, JP

We have proposed a compact model for four-terminal DG MOSFETs based on double charge-sheet model, with the velocity saturation effect as a function of carrier density profile inside the channel, with explicit handling of drain [...]

A charge based compact flicker noise model including short channel effects

Roy A.S., Enz C.C., EPFL, CH

The low-frequency (LF) noise in MOS devices has been the subject of intensive research during past years. It is becoming a major concern for scaled devices because the LF noise increases as the inverse of [...]

Gummel Symmetry with Higher-order Derivatives in MOSFET Compact Models

See G.H., Zhou X., Chandrasekaran K., Chiah S.B., Zhu G.J., Zhu Z.M., Lim G.H., Wei C.Q., Lin S-H, Zhu G.J., Zhu Z.M., Nanyang Technological University, SG

One of the critical problems in Gummel symmetry at higher-order derivatives that still exists in current and next generation MOS compact models has been solved with a simple modification of the mathematical smoothing function. The [...]

Theory of source-drain partitioning in MOSFET

Roy A.S., Enz C.C., Sallese J.M., EPFL, CH

The Ward-Dutton (WD) partitioning scheme is used extensively to develop transient and high frequency advanced compact models for MOSFET devices. Recently it has been shown that WD partitioning fails for field dependent mobility or for [...]

Simulating CMOS Circuits Containing Multiple FET Types Including the Geometric Dependence of Correlation between FET Types

Park J-E, Park S-J, Liang C-H, Assenmacher J., Watts J., Park J-E, Park S-J, Wachnik R., IBM, US

MOSFET device of similar design but different threshold voltage are often built on a single chip. It is important to be able to simulate with a compact model the variation of such devices including the [...]

Keywords: MOSFET