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Home2012June

Month: June 2012

TechConnect Proceedings Papers

Modeling and Analysis of MOS Capacitor Controlled by Independent Double Gates

Thakur P.K., Mahapatra S., Indian Institute of Science, Bangalore, IN
This paper, for the first time, explores the charcatersictics of MOS capacitor controlled by independent double gates by numerical simulation and analytical modeling for its possible use in RF circuit design as a varactor. By [...]

Discreteness and Distribution of Drain Currents in FinFETs

Lu N., IBM, US
It is likely that the characterization and modeling of a finFET will be carried out on a multi-fin structure, since it is a single electrical device functionally. Discreteness of multiple fins in a multi-fin FET [...]

Unified Modeling of Multigate MOSFETs Based on Isomorphic Modeling Principles

Fjeldly T.A., Monga U., Norwegian University of Science and Technology, NO
A compact, unified and analytical model is presented for the 3D electrostatics of nanoscale, multigate MOSFETs. The model is based on solutions of the 3D Laplace equation (subthreshold) and Poisson’s equation (above threshold), where suitable [...]

Modeling of DMOS Device for High-Voltage Applications Based on 2D Current Flow

Ueno F., Tanaka A., Miyake M., Iizuka T., Yamamoto T., Kikuchihara H., Mattausch H.J., Miura-Mattausch M., Miura-Mattausch M., Hiroshima University, JP
High-voltage devices are utilized for a variety of applications, with application voltages ranging from a few volts to a few hundred volts. To develop efficient circuits for the variety of applications, accurate modeling of the [...]

Modeling of Trench-Gate Type HV-MOSFETs for Circuit Simulation

Iizuka T., Fukushima K., Tanaka A., Ueno M., Miura-Mattausch M., Hiroshima University, JP
A wide range of application has made high-voltage (HV) MOSFETs evolve into application-specific structures. Trench-gate type HV-MOSFET is one of them; its user application space tends to fall on a larger power consumption domain, compared [...]

Compact Model for Intrinsic Capacitances in AlGaN/GaN HEMT Devices

Khandelwal S., Fjeldly T.A., NTNU, NO
We present a physics-based analytical compact model for intrinsic gate-source and gate-drain capacitances (CGS and CGD) in AlGaN/GaN HEMT these devices. The gate-channel capacitance Cch is derived from the unified 2-DEG charge density model developed [...]

Model the AlGaN/GaN High Electron Mobility Transistors

Wang Y., Tsnghua University, CN
We developed a set of physics-based compact model of GaN HEMT for RF and high power applications. The model includes close-formed I-V, the C-V characteristics, high frequency noise characteristics, self heating effect, small signal and [...]

An analytical 2DEG model considering the two lowest subbands

Zhang J., Zhou X., NTU singapore, SG
A general 2DEG density model that considers the lowest two subbands (subband split) as well as the subthrehold region is derived and validated through comparison with the numerical (exact) solutions. Good agreement is obtained between [...]

Design Methodology for Ultra Low-Power Analog Circuits using Next Generation BSIM 6 Compact Model

Enz C.C., Mangla A., Chalkiadaki M.-A., Ecole Polytechnique Fédérale de Lausanne (EPFL), CH
The design of analog circuits strongly relies on the accuracy of the models available in the circuit simulators. The recently proposed BSIM6 bulk MOSFET compact model is set to replace the hitherto widely used BSIM3 [...]

BSIM6: Symmetric Bulk MOSFET Model

Chauhan Y.S., Karim M.A., Venugopalan S., Khandelwal S., Niknejad A., Hu C., University of California-Berkeley, US
BSIM6 Model is the next generation Bulk RF MOSFET Model. Model uses charge based core with all physical models adapted from BSIM4 model. Model fulfills all quality tests e.g. Gummel symmetry and AC symmetry etc. [...]

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