Model the AlGaN/GaN High Electron Mobility Transistors


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We developed a set of physics-based compact model of GaN HEMT for RF and high power applications. The model includes close-formed I-V, the C-V characteristics, high frequency noise characteristics, self heating effect, small signal and large signal model. This model shows good agreement with the experimental data and has two-order continuity. The models can be implemented in commercial circuit simulator and is easy to be utilized for correlative circuits design.

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Journal: TechConnect Briefs
Volume: 2, Nanotechnology 2012: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational (Volume 2)
Published: June 18, 2012
Pages: 738 - 743
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 978-1-4665-6275-2