Sensors, MEMS, Electronics – Page 95

UF “Compact” Models: A Historical Perspective

Fossum J.G., University of Florida, US

The history of the developments of “compact” models for SOI MOSFETs at the University of Florida (UF) is reviewed. The uniqueness and innovation of the UF “process-based” models are reiterated, and their global utility as [...]

MOSFET threshold voltage: definition, extraction, and applications

Machado M.B., Siebel O., Schneider M.C., Galup-Montoro C., Federal University of Santa Catarina, BR

The threshold voltage VT is a fundamental parameter in the characterization of MOS transistors and should be used, whatever is the adopted model for the transistor. The classical definition of threshold: phis = 2phiF +V [...]

Complete Surface-Potential Modeling Approach Implemented in the HiSIM Compact Model Family for Any MOSFET Type

Miura-Mattausch M., Miyake M., Kikuchihara H., Feldmann U., Amakawa S., Mattausch H.J., Miura-Mattausch M., Hiroshima University, JP

Many possible future device structures are investigated in parallel to obtain highest performance features. It has been shown that an SOI-MOSFET with a thin body enables both high device performances and suppression of statistical variations. [...]

Compact Modeling

Imbibition dynamics of nano-particulate ink-jet drops on micro-porous media

Hsiao W.-K., Hoath S.D., Martin G.D., Hutchings I.M., Jones S., Chilton N., University of Cambridge, UK

Our study represents the first investigation of imbibition of ink-jet deposited nano-Cu colloid drops on a proprietary coated paper substrate. Using high speed imaging apparatus to capture the depsoition of ink-jet drops, the timescales of [...]

Expanding Capabilities of a Machine Vision System for Analysis of Drops-in-flight

Kipman Y., Mehta P., Wang S-W., ImageXpert Inc., US

Measuring in-flight characteristics of ink drops under different conditions can provide insight into relationships and interactions, helping drive system and consumable optimization for manufacturers of inkjet heads, head driver electronics, inks, and integrated printing and [...]

Sector: Sensors, MEMS, Electronics

UF “Compact” Models: A Historical Perspective

MOSFET threshold voltage: definition, extraction, and applications

Complete Surface-Potential Modeling Approach Implemented in the HiSIM Compact Model Family for Any MOSFET Type

Compact Modeling

Imbibition dynamics of nano-particulate ink-jet drops on micro-porous media

Expanding Capabilities of a Machine Vision System for Analysis of Drops-in-flight

Advancements in Ink-Jet Deposition of Carbon Nanotube Materials for Printed Electronics

New developments in inkjet of deposits carried out under localised extraction or helium

Inkjet Design, Materials & Fabrication

Numerical Simulation of the Solidification of Water-Based Nanofluid