Application of Multi-frequency Test and Neural Network to Fault Diagnosis in Analog Circuits
Chan M., He J., Liang H-L, Mei J., Wang C., Wang H., Ye Y., PKU-HKUST Shenzhen-Hongkong Institution, CN
In this paper, the multi-frequency test and neural networks (NNs) are applied to fault diagnosis in analog circuits. The reason is that multi-frequency test can maximize differences between the failure and the normal circuit’s response, [...]