Nanoscale Materials Characterization

Papers:

The methodology and the software for the analysis of the atomic density modulation underneath the surface of a nanocrystal

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Internal structure of nanocrystals can be extracted from Pair Distribution Function, which is obtained by Fourier transform of the diffraction data. Such a transform, G(r), contains complete information on inter-atomic distances present in the investigated [...]

Use of Single Particle Inductively Coupled Plasma Mass Spectrometry to Characterize a New Silver Nanoparticle Reference Material

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In this study we use a conventional inductively coupled plasma mass spectrometer operated in single particle mode (spICP-MS) to simultaneously characterize the size distribution and dissolved silver fraction of a new candidate silver nanoparticle reference [...]

Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2014: Graphene, CNTs, Particles, Films & Composites
Published: June 15, 2014
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4822-5826-4