Nanoscale Materials Characterization

Papers:

Subsurface characterization of high dielectric nanostructures in low dielectric polymer matrix using Electric Force Microscopy and Scanning Electron Microscopy

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Scanning Probe Microscopy (SPM) and Scanning Electron Microscopy (SEM) are two powerful techniques for surface characterization of nanostructures. With the development of nanotechnology, there is a growing need to nondestructively characterize nanostructures at the subsurface [...]

Effect of compounding method on the thermal, mechanical, and molphological properties of Polypropylene-Nanoclay nanocomposites

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This study investigates the effects of direct melt compounding, masterbatch dilution and compatibilzer addition on the mechanical and morphological properties of organoclay nanocomposites. Nanoclay reinforced Polypropylene composites were manufactured using melt mixing with and without [...]

Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites
Published: June 21, 2010
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-3401-5