Magnetic properties of Sputter deposited and magnetically annealed IrMn/CoFeB nanometric bilayers for exchange biased magnetic tunnel junctions

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The work relates to the exploring the means of controlling the coercivities of the ferromagnetic thin films in a Magnetic Tunnel Junction Stack. Exchange bias route is a very powerful route in achieving this task. We intend to demonstrate this in the CoFeB(FM)-IrMn(AF) bilayers grown by sputtering technique.

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Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites
Published: June 21, 2010
Pages: 133 - 136
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-3401-5