Muñoz Aguirre N., Rivera López J.E., Martínez Pérez L., Tamayo Meza P.
Instituto Politecnico Nacional, MX
Keywords: atomic force microscopy, c-AFM, nano-generator, piezoelectric ZnO thin films
Conductive Atomic Force Microscopy (c-AFM) [1][2] characterization was made on Aluminum doped ZnO thin films. Furthermore, to the electrical resistance associated to the surface of the film, was in series connected a load resistance as shown in Figure 1. With no voltage applied to the AFM tip, a voltage throughout the load resistance only generated by the atomic force tip-sample interaction, while the scanning is taking place [3], was measured and shown in Figure 2.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2010: Advanced Materials, CNTs, Particles, Films and Composites
Published: June 21, 2010
Pages: 122 - 124
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-3401-5