Papers – Page 29 – TechConnect Briefs

A Novel Battery Architecture Based on Superhydrophobic Nanostructured Materials

Lifton V.A., Simon S., mPhase Technologies, US

Everyone uses batteries. They come in many sizes, shapes, power densities, and support a wide variety of military, commercial and consumer applications. Therefore, it is surprising how little battery technology has changed since the 1960s [...]

High Resolution Mapping of Compositional Differences at Electrode Interfaces by Electric Force Microscopy

Edwards G.A., Driskell J.D., Bergren A.J., Lipert R.J., Porter M.D., Ames Laboratory - U.S. DOE, US

Benzyl mercaptan-derived monolayers (X-C6H4-CH2-SH) with various substituents are interrogated on a smooth gold substrate by Electric Force Microscopy. Plots of phase shift vs. dc bias voltage are presented. The basis for the expected two-dimensional phase [...]

Atomic Force Microscope as a Tool for Nanometer Scale Surface Patterning

Lemeshko S.V., Saunin S.A., Shevyakov V.A., Nanotechnology Instruments Europe B.V., NL

The progress in scanning probe microscopy (SPM) has transformed scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) from measuring devices into technological tools. Local surface modification by scanning probe allows us to treat materials [...]

Theoretical and Experimental Study of Synthetic MFM Tips

Wu Y.H., Han G., Zheng Y.K., National University of Singapore, SG

Recently, we have developed a synthetic MFM tip consisting of two ferromagnetic layers and a non-magnetic spacer [1]. The two ferromagnetic layers are coupled antiferromagnetically so that the MFM works in a differential detection mode. [...]

Comparative Study of Fabrication Patterns of a Ferroelectric Polymer P(VDF-TrFE) on Gold Thin Film and Gold Ball via Dip-pen Nanolithography

Tang Q., Shi S.Q., Zhou L.M., Xu C.H., The Hong Kong Polytechnic University, CN

An AFM-based nanolithography, dip-pen nanolithography is becoming a promising nanotechnology since its invention.However, there exists much uncertaintied in DPN process.Much research work are required to do in order to make it as a competitive nanolithography [...]

MEMS/NEMS Dynamics Measurement Tool Using The Stroboscopic Principle

Liao H-H, Yang Y-J, National Taiwan University, TW

Recently, the rapid growth of micro- and nano-electromechanical systems (MEMS/NEMS) boosts the demands of advanced diagnostic tools and characterization techniques. One of the most critical demands is the high-resolution tools for measuring MEMS/NEMS dynamic behaviors, [...]

Novel Ion Beam Tools for Nanofabrication

Ji Q., Jia L., Jianga X., Jianga X., Jia L., Jianga X., Chena Y., van der Akker B., Leung K.-N., Lawrence Berkeley National Laboratory, US

The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. Ion beams have played a significant role in nanoscience and technology both in material modification (e. g., ion [...]

New Developments in Spectroscopic Ellipsometry for Nano Sciences

Piel J.-P., Darragon A., Defranoux C., SOPRA-SA, FR

Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface [...]

Integrated Optical Profiler and AFM: a 3D Metrology System for Nanotechnology

Jobin M., Du A., Foschia R., University of Applied Sciences, CH

A versatile 3D metrology tool for nanotechnology purpose has been built. It consist of an home-made white-light interferance microscope operating in the vertical scanning mode, integrated into a commercial Atomic Force Microscope. The performance in [...]

An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size Standards

Vasiliou J., Duke Scientific Corporation, US

A scanning mobility particle sizer (TSI Model 3936) was evaluated using Duke Scientific NIST traceable particle size standards as well as NIST SRM’s. The importance of instrument setup, electrospray operation and sample preparation for polystyrene [...]