Piel J.-P., Darragon A., Defranoux C.
SOPRA-SA, FR
Keywords: spectroscopic ellipsometry
Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface like interferometry nor reference materials or reference beam like in absorption spectroscopy (IRRAS): this is an absolute technique often called first principal technique.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 698 - 702
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 0-9767985-1-4