Papers – Page 30 – TechConnect Briefs

Advanced Particle Beam Technologies for Nano-Characterization and Fabrication

Mulders J.J.L., Greiser J., FEI Company, NL

As the structures under investigation grow ever smaller, the need for high resolution, nanoscale imaging and protoyping is a constant factor. The presented range of DualBeam and single column focused ion and electron beam microscopes [...]

Optimization of Nano-Machining with Focused IonBeams

Giannuzzi L.A., Anzalone P., Phifer D., FEI Company, US

It is shown that by optimizing ion-solidinteractions, nano-lines of different aspect ratios can be machined into samples using focused ionbeams.

Simultaneous Topography and RECognition Mapping with PicoTREC™: A Powerful New Technology That Can Be Used To Map Nanometer-Scale Molecular Binding Sites On A Variety Of Surfaces

Johnson W.T., Kada G., Stroh C., Gruber H., Wang H., Kienberger F., Ebner A., Lindsay S., Hinterdorfer P., Molecular Imaging, Corp., US

PicoTRECTM is a new Topography and RECognition imaging solution that requires no fluorescence, radioactivity, enzyme-linked detection schemes or other extraneous labels. It combines real-time detection of molecular recognition events and single-molecule sensitivity with the imaging [...]

Nonlinear Response in Nanoshear Modulation Force Microscopy: Fourier Analysis

Haugstad G., University of Minnesota, US

Oscillatory methods in scanning probe microscopy have enabled nanoscale tribology and rheology investigations on polymeric systems. Among these methods, shear modulation force microscopy has been used to probe phenomena such as the stick-to-slide transition, time-delayed [...]

Quantification of Properties for Ferroelectric Thin Films Using Piezo-response Force Microscopy

Cain M.G., Lowe M.J., Cuenat A., Stewart M., Blackburn J., National Physical Laboratory, UK

Ferroelectric thin films are used within FE-RAM Memory devices, thermal imaging cameras and for new and emerging micro-integrated applications. Piezo Force Microscopy (PFM) is a method that can be used to probe (using a modified [...]

Visualizing Nano-Electromechanics by Vector Piezoresponse Force Microscopy

Rodriguez B.J., Jesse S., Baddorf A.P., Kalinin S.V., Gruverman A., Oak Ridge National Laboratory, US

This is a detailed examination of the electro-mechanical and elastic coupling that occurs in the scanning probe microscopy of electro-active materials. This research is useful to detecting, imaging and understanding the orientation of nanoscale electromechanical [...]

Mechanical Nonlinear Generation with Coupled Torsional Harmonic Cantilevers for Sensitive and Quantitative Atomic Force Microscopy Imaging of Material Characteristics

Sahin O., Quate C.F., Solgaard O., Stanford University, US

Tapping-mode atomic force microscopy has been the most widely used mode of operation. Due to non-linear tip-sample forces, dynamics of the cantilever motion is an extremely rich problem. Recent studies have shown that higher harmonics [...]

Growth of Si Nanowires on Nano Catalyst Corners

Wang C., Malladi K., Madou M., University of California Irvine, US

One dimensional structure with nanometer diameters, such as Si nanowires, have great potential for understanding and testing fundamental concepts about the roles of dimensionality in optical, electrical and mechanical properties and for applications ranging from [...]

Conductivity of the Crystalline Boron Nanowires Measured in TEM

Lourie O., Gatan Inc., US

In this experiment we report on using in-situ STM-TEM system and EELS to characterize the electronic properties of the boron nanowires. We use low loss EELS approach to study the band structure and the dielectric [...]

Acid Transformation of TiO2 Nanotubes to Nanoparticles

Bavykin D.V., Lapkin A.A., Friedrich J.M., Walsh F.C., University of Bath, UK

Transformation of TiO2 nanotubes in the presence of sulfuric acid to TiO2 nanoparticles was studied. The possible physico - chemical reasons for such transformations are critically discussed.