US – Page 418 – TechConnect Briefs

Fullband Particle-based Simulation of Optical Excitation in Silicon Pin Diodes

Wigger-Aboud S., Saraniti M., Goodnick S., Brodschelm A., Leitenstorfer A., Rush Medical Center and Illinois Institute of Technology, US

A fullband particle-based simulator is used to model photo-generated electron-hole pairs in Si. This work is motivated by experimental measurements of optically excited Si pin diodes. Results will be compared qualitatively to investigate charge transport [...]

Semi-Analytic Boltzmann Model for the Substrate Current of Short-Channel MOSFETs with Lightly Doped Drains

Morris H.C., De Pass M.M., San Jose State University, US

As MOSFET sizes have been reduced to nano-scale dimensions, existing models of device behavior, such as the drift diffusion equations, cease to be valid. In the nano domain, more fundamental equations, such as the Boltzmann [...]

Lateral-Cavity Design for Long-Wavelength Vertical-Cavity Lasers

Piprek J., Bregy A., Jayaraman V., Chiu Y-J, Bowers J., University of California, US

For more than a decade, long-wavelength vertical-cavity lasers (VCLs) for fiber-optic applications are subject of intense research efforts. GaAs-based VCLs emitting at shorter wavelength (0.85-micron) have been commercialized successfully, however, the challenge of transferring this [...]

Single Transistor AND Gate

Chengalvala V., Zhang Y., Oklahoma State University, US

Double-gate SOI MOSFET structure opens the door for many novel devices by the coupling of the two gates. If the same voltage is applied to both gates, the depletion regions are equally partitioned. On the [...]

Monte Carlo and Energy Balance Simulations of a Deep Sub-micrometer Conventional and Asymmetric MOSFET Device Structures

Mannargudi A., Vasileska D., Arizona State University, US

We have simulated a 100 nm assymetric MOSFET device structure using both the Silvaco ATLAS energy balance model and the in-house 2D Monte Carlo particle-based simulator. Our investigations show that the energy balance simulation results [...]

Process for Extremely Thin Silicon-on-Insulator Wafer

Usenko A.Y., Carr W.N., Chen B., Silicon Wafer Technologies, Inc., US

We observe hydrogen platelets buildup into single crystalline silicon caused by hydrogen plasma processing. The platelets are aligned along a layer of lattice defects formed in silicon before plasma processing. The buried defect layer is [...]

A Novel Method of Stereolithographic Alignment for MEMS Structures

Choudhury A., Hesketh P.J., Georgia Institute of Technology, US

In recent years there has been a fair amount of interest in integration of stereolithography with MEMS devices for purposes of packaging of microfluidic devices or to build new MEMS devices that are able to [...]

Wafer-Level High Density Multifunctional Integration (HDMI) for Low-Cost Micro/Nano/Electro-Opto/Bio Heterogeneous Systems

Gutmann R.J., Lu J-Q, McMahon J.J., Persans P.D., Cale T.S., Eisenbraun E.T., Castracane J., Kaloyeros A.E, Rensselaer Polytechnic Institute, US

A technology platform -wafer-scale high density multifunctional integration (HDMI) -is described which offers the potential for low-cost integration of information processing and sensor/actuator technologies for future microelectronic, nanoelectronic, mixed electro-optical and bio-molecular systems. The HDMI [...]

A New, Topology Driven Method for Automatic Mask Generation from Three-Dimensional Models

Schiek R., Schmidt R., Sandia National Laboratories, US

We have developed an algorithm which when given a three-dimensional object can infer from the objects topology the two-dimensional masks needed to produce that object with surface micromachining.Our algorithm, called Faethm, calculates the required two-dimensional [...]

Characterization of Microscale Material Behavior with MEMS Resonators

White C.D., Xu R., Sun X., Komvopoulos K., University of California-Berkeley, US

The reliability of MEMS devices greatly depends on precise characterization of material behavior at the micron scale. This paper presents a novel material characterization device for fatigue testing. The fatigue specimen is subjected to multi-axial [...]