TW – Page 32 – TechConnect Briefs

A Two-Dimensional Numerical Simulation of Organic Light-Emitting Devices

Li Y., Lee B-S, Lee J.W., Chen P., Chen W-H, Lee B-S, Lee J.W., Lu C-S, Chen P., Chen W-H, National Chiao Tung University, TW

Organic light-emitting devices (OLEDs) add a completely new dimension to current display technology [1-3]. OLED displays are thinner, lighter, brighter, and cheaper to manufacture; which also consume less power than the current thin displays do. [...]

Enhancement of Silicon Photon Emission with Nanostructure Array

Li J.L., Kuan C.H., Peng Y.H., Lo H-C, Chen L-C, National Taiwan University, TW

Initiated by the high photon-emission nature of the porous silicon materials and the light transmission enhancement characteristics of the photonic crystals, the research of silicon Raman scattering of array nanostructures built by the electron beam [...]

Visible Light Emission from Si-related Nanostructures and the Effect of Ambient Atmosphere on Photoluminescence

Tsai M.-Y., Chi C.-C., Perng T.P., National Tsing Hua University, TW

Two different types of visible light emission were observed from the Si-related nanostructures prepared by vapor condensation in an Ar-5%O2 atmosphere at various working pressures (1, 30, 50, and 100 torr). The specimen prepared at [...]

A Highly Reliable Pattern Transfer of Hydrogen Silsequioxane

Liu J.F., Chen H.J.H., Chen S.Z., Chen H.J.H., Chen S.Z., Huang F.S., National Tsing Hua University, TW

In this paper, we focus on the effects of process parameters on pattern embossing into HSQ films, and the pattern degradation of HSQ for room temperature aging effects. The dilution of HSQ affects not only [...]

Au Nano-Wire Transferring onto HSQ by Nano Imprinting Technology

Liu J.F., Hsu Y.J., Chen J.H., Chen S.Z., Huang F.S., Chen J.H., Chen S.Z., National Tsing Hua University, TW

In this paper, we present the technique of transferring Au nano-wire on HSQ by using nano imprint. The Au nano-wires were fabricated by electroless-plating and investigated by TEM analysis. The stable nano imprinting and suitable [...]

Observation of Soft-Breakdown in Ultra-Thin SiO2 Films under Repetitive Ramped Voltage Stress by Using Conductive Atomic Force Microscopy

Wu Y-L, Lin S-T, Liao J-C, National Chi-Nan University, TW

The degradation and breakdown characteristics of ultra-thin SiO2 (Tox = 5 nm) were investigated by using conductive AFM (C-AFM). Repetitive ramped voltage stress (RVS) was applied through the C-AFM tip to the oxide with polarity [...]

A Novel SPICE Compatible Current Model for OLED Circuit Simulation

Li Y., Lee B-S, Lee J.W., Lee B-S, Lee J.W., Lu C-S, Chen W-H, National Chiao Tung University, TW

high quality, and low power consumption display [1-2]. It is known that the brightness of the OLED is controlled by the current density of the device; therefore, precisely controlling the current density of active matrix [...]

Random Dopant Induced Fluctuations of Characteristics in Deep Sub-micron MOSFETs

Chou H-M, Lo S-C, Tsai J-H, Li Y., NCHC, TW

As the gate length of MOSFET devices shrinks down below 100 nm, the fluctuation of major devices parameter, namely, threshold voltage (VTH), subthreshold swing, drain current (ID) and subthreshold leakage current duo to influences of [...]

MEMS/NEMS Dynamics Measurement Tool Using The Stroboscopic Principle

Liao H-H, Yang Y-J, National Taiwan University, TW

Recently, the rapid growth of micro- and nano-electromechanical systems (MEMS/NEMS) boosts the demands of advanced diagnostic tools and characterization techniques. One of the most critical demands is the high-resolution tools for measuring MEMS/NEMS dynamic behaviors, [...]

Diamond Growth on an Array of Seeds: The Revolution of Diamond Production

Sung J.C-M, Tai M-F, Kinik Company, TW

Industrial diamond production was pioneered by General Electric Company of U. S. in 1957 and followed by De Beers of S. Africa in 1961. The two companies optimized the production of diamond grits by heating [...]