NL – Page 3 – TechConnect Briefs

Focused Ion Beam machining of large and complex nanopatterns

Wilhelmi O., Roussel L, Anzalone P., Stokes D.J., Faber P., Reyntjens S., FEI Company, NL

Modern FIB columns have not only reduced minimum spot sizes, but has also improved beam profiles at large and intermediate FIB currents. Focused ion beams with high beam currents and yet small spot sizes and [...]

A Semiclassical Study of Carrier Transport combined with Atomistic Calculation of Subbands in Carbon Nanoribbon Transistors

Rondoni D., Hoekstra J., Lenzi M., Grassi R., Technical University of Delft, NL

In this paper we present a self-consistent solution of carrier transport in thin carbon nanoribbons. An atomistic Schroedinger-Poisson solver is coupled with a deterministic solution of the Boltzmann Transport Equation. Results in ballistic and phonon [...]

The static behavior of RF MEMS capacitive switches in contact

Suy H.M.R., Herfst R.W., Steeneken P.G., Stulemeijer J., Bielen J.A., NXP Semiconductors Research, NL

A method is presented in which surface topography characterization is combined with the electrical measurement of the contact mechanics under electrostatic loading. Contact characteristics such as the surface separation versus the applied pressure, and the [...]

Advances in Automated 3D cortex image data acquisition

Lich B., Greiser J., Faber P., Knott G., FEI Company, NL

The study of the 3D architecture of cortex requires the creation of image datasets with sufficient detail in all directions. The detail level required to produce meaningful data requires imaging quality that allows identification of [...]

The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis

Hubert D.H.W., Freitag B., Stokes D.J., FEI Company, NL

As the limits of nanotechnology are expanded ever further, so too must we push back the frontiers of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the [...]

Characterisation of Native-State Soft Matter using ‘Multi-Mode’ Electron Microscopy

Stokes D.J., Baken E., Lich B.H., Hubert D.H.W., FEI Company, NL

Soft condensed matter and complex fluids are of increasing technological significance. It is therefore crucial that we extend the capabilities of conventional solid state imaging and analytical techniques to include the observation of materials such [...]

Advanced CryoTEM and Tomography for Two- and Three-Dimensional Nano-Characterisation of Soft Matter

Sourty E., de Haas F., Frederik P.M., Frederik P.M., Loos J., Stokes D.J., Hubert D.H.W., FEI Company, NL

Recent advances in transmission electron microscopy (TEM) mean that we are able to achieve unprecedented resolution at the atomic level. Furthermore, improved methods for obtaining and reconstructing tilt series projections allow us to create high [...]

An Efficient Sectionalized Modeling Approach for Introduction of

Milovanovic V., Mijalkovic S., Delft University of Technology, NL

Modeling of breakdown phenomena is becoming central problem in today's design of high-speed bipolar circuits. It is especially important for the output stages that should simultaneously provide speed and output signal power. To this end, [...]

A PSP based scalable compact FinFET model

Smit G.D.J., Scholten A.J., Serra N., Pijper R.M.T., van Langevelde R., Mercha A., Gildenblat G., Klaassen D.B.M., NXP Semiconductors, NL

A high-quality compact FinFET model is a prerequisite for initial circuit design and evaluation of these prospective replacements for conventional bulk MOSFETs. Our PSP-based compact model for symmetric 3-terminal FinFETs with thin undoped or lightly [...]

Drop formation mechanisms in piezo-acoustic inkjet

Wijshoff H.M.A., Océ Technologies B.V., NL

Drops are generated with a piezo inkjet device. A piezo actuator drives each channel. Drops are measured with stroboscopic illumination or high-speed camera recordings. The phenomena inside the channels are hard to measure. Modeling give [...]