Hubert D.H.W., Freitag B., Stokes D.J.
FEI Company, NL
Keywords: aberration corrector, monochromator, single atoms, spectroscopy, sub-angstrom resolution
As the limits of nanotechnology are expanded ever further, so too must we push back the frontiers of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the development of electron microscopy and spectroscopy to the extremes of performance. For example, aberration-corrected S/TEM gives us the ability to work at sub-angstrom length-scales. This, combined with sharply-defined energy resolution, enables us to acquire information at the single atomic level and gain knowledge of inter-atomic bonding for characterisation of chemical composition, electronic structure and mechanical properties. In addition, there is scope for capturing time-resolved structural transformations with sub-nanometer detail, enabling us to directly observe and understand the dynamics of a range of chemical processes in situ. We discuss the advances that have enabled these technological breakthroughs and demonstrate the potential for new insights in nano-characterisation and analysis.
Journal: TechConnect Briefs
Volume: 4, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Published: May 20, 2007
Pages: 85 - 88
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 1-4200-6376-6