Steeneken P.G. – TechConnect Briefs

The static behavior of RF MEMS capacitive switches in contact

Bielen J.A., Herfst R.W., Steeneken P.G., Stulemeijer J., Suy H.M.R., NXP Semiconductors Research, NL

A method is presented in which surface topography characterization is combined with the electrical measurement of the contact mechanics under electrostatic loading. Contact characteristics such as the surface separation versus the applied pressure, and the [...]

A new compact scalable circuit model for RF MEMS switches

Huizing H.G.A., Steeneken P.G., Suy H.M.R., Yanson O.I., NXP Semiconductors, NL

In this paper, a new compact scalable circuit model for RF MEMS switches is presented. This new one-dimensional model combines the computational speed of one-dimensional models, with the accuracy of multi-dimensional models. The model includes [...]