Nanoscale Characterization

Papers:

Measurement of Structural and Mechanical Property of Live Mesangial Cell (MC) by Atomic Force Microscopy (AFM)

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Atomic force microscopy (AFM) has become an important device to visualize various cells and biological materials for non-invasive imaging. The major advantage of AFM compared to the conventional optical and electron microscopes is its convenience. [...]

Growth, Electrical and Optical Properties of SnO2:F on ZnO , Si and Porous Si Structure

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1- Instituto de Física, Universidade Federal da Bahia, Ondina, Salvador-Ba,40210-340, Brazil 2- CETEC-Universidade Federal do Recôncavo da Bahia, Cruz das Almas-Ba, 44380-000, Brazil 3- Department of Materials Science and Engineering, Royal Institute of Technology,SE-100 44 [...]

Dispersed stabilized Pt nanoparticles synthesized from an organometallic precursor

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In electrocatalysis, carbon materials have been generally employed to support metallic nanoparticles for electrochemical applications. Many methods to prepare CNTs supported metal nanoparticles including electrochemical, microwave irradiation and wet chemical methods have been reported in [...]

Preparation of Y3Al5O12:Eu3+ waveguide films by sol-gel method

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In this work, Y3Al5O12:Eu3+ (5 mol% Eu3+) optical thick films were obtained by sol-gel process. The films were dip-coated by dip-coating technique. The synthesis was accomplished using metal organic precursors, such as Al(tri-sec-butoxide) Al(OC4H9)3, yttrium [...]

Effects of centrifugation on the carboxyl modified single-walled carbon nanotubes suspension

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In this paper, the properties of supernatant samples obtained go through steps of acids oxidation and centrifugation is characterized by UV-VIS-NIR spectroscopy and Raman spectroscopy. The ultraviolet-visible-near infrared absorption spectra of each sample show the [...]

Accommodation of Characterization Tools: Understanding the Building Vibration, Stray Electromagnetic Fields and Acoustic Interference to Avoid Catastrophic Inferences in New Building Construction or Building Renovations

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Characterization tools are the cornerstone to nanoscale research including microscopy (TEM, SEM, AFM and Aberration Corrected Electron Microscopy), spectroscopy/spectrometry (NMR, FTIR, Acoustic), and advanced nano mechanical (nano scale manipulations) tools. Characterization tools are highly sensitive [...]

Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7