Kim B.M., Adams D.E., Tran Q., Ma Q., Rao V.
Nanochip, Inc., US
Keywords: charge, ferroelectricity, piezoelectricity, probe, R/W
Probe storage with epitaxial ferroelectric PbZr0.2Ti0.8O3 (PZT) media [1, 2] is a promising technology for terabyte/inch2 storage devices because nanoscale and nonvolatile polarizations may be reversibly written and read by a scanning probe tip. Piezoresponse Force Microscopy (PFM) [1] is a popular Scanning Force Microscopy (SFM)-based polarization bit reading technique that relies on an optical setup of SFM with lock-in technique to read piezoresponse motion of ferroelectric domains. Compared to PFM, Scanning Probe Charge Reading Technique (SPCRT) [2] uses an exclusively electrical setup comprising a charge amplifier to read charge signals associated with ferroelectric domains. A variant mode of SPCRT implemented with lock-in technique is demonstrated here to resolve bit charge on PZT with nanoscale spatial resolution. [1] T. Tybell, C. H. Ahn, and J.-M. Triscone, Appl. Phys. Lett. 72(12), 1454 (1998) [2] B. M. Kim, D. E. Adams, Q. Tran, Q. Ma and V. Rao, Appl. Phys. Lett. 94(7), (2009). in press.
Journal: TechConnect Briefs
Volume: 1, Nanotechnology 2009: Fabrication, Particles, Characterization, MEMS, Electronics and Photonics
Published: May 3, 2009
Pages: 289 - 290
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 978-1-4398-1782-7