Tapping-mode atomic force microscopy has been the most widely used mode of operation. Due to non-linear tip-sample forces, dynamics of the cantilever motion is an extremely rich problem. Recent studies have shown that higher harmonics [...]
This is a detailed examination of the electro-mechanical and elastic coupling that occurs in the scanning probe microscopy of electro-active materials. This research is useful to detecting, imaging and understanding the orientation of nanoscale electromechanical [...]
Ferroelectric thin films are used within FE-RAM Memory devices, thermal imaging cameras and for new and emerging micro-integrated applications. Piezo Force Microscopy (PFM) is a method that can be used to probe (using a modified [...]
Oscillatory methods in scanning probe microscopy have enabled nanoscale tribology and rheology investigations on polymeric systems. Among these methods, shear modulation force microscopy has been used to probe phenomena such as the stick-to-slide transition, time-delayed [...]
, Gruber H.
, Hinterdorfer P.
, Johnson W.T.
, Kada G.
, Kienberger F.
, Lindsay S.
, Stroh C.
, Wang H.
, Molecular Imaging, Corp., US
PicoTRECTM is a new Topography and RECognition imaging solution that requires no fluorescence, radioactivity, enzyme-linked detection schemes or other extraneous labels. It combines real-time detection of molecular recognition events and single-molecule sensitivity with the imaging [...]
It is shown that by optimizing ion-solidinteractions, nano-lines of different aspect ratios can be machined into samples using focused ionbeams.
As the structures under investigation grow ever smaller, the need for high resolution, nanoscale imaging and protoyping is a constant factor. The presented range of DualBeam and single column focused ion and electron beam microscopes [...]
A scanning mobility particle sizer (TSI Model 3936) was evaluated using Duke Scientific NIST traceable particle size standards as well as NIST SRM’s. The importance of instrument setup, electrospray operation and sample preparation for polystyrene [...]
A versatile 3D metrology tool for nanotechnology purpose has been built. It consist of an home-made white-light interferance microscope operating in the vertical scanning mode, integrated into a commercial Atomic Force Microscope. The performance in [...]
Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface [...]
The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. Ion beams have played a significant role in nanoscience and technology both in material modification (e. g., ion [...]
Recently, the rapid growth of micro- and nano-electromechanical systems (MEMS/NEMS) boosts the demands of advanced diagnostic tools and characterization techniques. One of the most critical demands is the high-resolution tools for measuring MEMS/NEMS dynamic behaviors, [...]
An AFM-based nanolithography, dip-pen nanolithography is becoming a promising nanotechnology since its invention.However, there exists much uncertaintied in DPN process.Much research work are required to do in order to make it as a competitive nanolithography [...]
Recently, we have developed a synthetic MFM tip consisting of two ferromagnetic layers and a non-magnetic spacer . The two ferromagnetic layers are coupled antiferromagnetically so that the MFM works in a differential detection mode. [...]
The progress in scanning probe microscopy (SPM) has transformed scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) from measuring devices into technological tools. Local surface modification by scanning probe allows us to treat materials [...]
Benzyl mercaptan-derived monolayers (X-C6H4-CH2-SH) with various substituents are interrogated on a smooth gold substrate by Electric Force Microscopy. Plots of phase shift vs. dc bias voltage are presented. The basis for the expected two-dimensional phase [...]
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging