Papers:
Mechanical Nonlinear Generation with Coupled Torsional Harmonic Cantilevers for Sensitive and Quantitative Atomic Force Microscopy Imaging of Material Characteristics
Tapping-mode atomic force microscopy has been the most widely used mode of operation. Due to non-linear tip-sample forces, dynamics of the cantilever motion is an extremely rich problem. Recent studies have shown that higher harmonics [...]
Visualizing Nano-Electromechanics by Vector Piezoresponse Force Microscopy
Rodriguez B.J., Jesse S., Baddorf A.P., Kalinin S.V., Gruverman A., Oak Ridge National Laboratory, US
This is a detailed examination of the electro-mechanical and elastic coupling that occurs in the scanning probe microscopy of electro-active materials. This research is useful to detecting, imaging and understanding the orientation of nanoscale electromechanical [...]
Quantification of Properties for Ferroelectric Thin Films Using Piezo-response Force Microscopy
Ferroelectric thin films are used within FE-RAM Memory devices, thermal imaging cameras and for new and emerging micro-integrated applications. Piezo Force Microscopy (PFM) is a method that can be used to probe (using a modified [...]
Nonlinear Response in Nanoshear Modulation Force Microscopy: Fourier Analysis
Oscillatory methods in scanning probe microscopy have enabled nanoscale tribology and rheology investigations on polymeric systems. Among these methods, shear modulation force microscopy has been used to probe phenomena such as the stick-to-slide transition, time-delayed [...]
Simultaneous Topography and RECognition Mapping with PicoTREC™: A Powerful New Technology That Can Be Used To Map Nanometer-Scale Molecular Binding Sites On A Variety Of Surfaces
Johnson W.T., Kada G., Stroh C., Gruber H., Wang H., Kienberger F., Ebner A., Lindsay S., Hinterdorfer P., Molecular Imaging, Corp., US
PicoTRECTM is a new Topography and RECognition imaging solution that requires no fluorescence, radioactivity, enzyme-linked detection schemes or other extraneous labels. It combines real-time detection of molecular recognition events and single-molecule sensitivity with the imaging [...]
Optimization of Nano-Machining with Focused IonBeams
It is shown that by optimizing ion-solidinteractions, nano-lines of different aspect ratios can be machined into samples using focused ionbeams.
Advanced Particle Beam Technologies for Nano-Characterization and Fabrication
As the structures under investigation grow ever smaller, the need for high resolution, nanoscale imaging and protoyping is a constant factor. The presented range of DualBeam and single column focused ion and electron beam microscopes [...]
An Evaluation of a Scanning Mobility Particle Sizer with NIST-Traceable Particle Size Standards
A scanning mobility particle sizer (TSI Model 3936) was evaluated using Duke Scientific NIST traceable particle size standards as well as NIST SRM’s. The importance of instrument setup, electrospray operation and sample preparation for polystyrene [...]
Integrated Optical Profiler and AFM: a 3D Metrology System for Nanotechnology
A versatile 3D metrology tool for nanotechnology purpose has been built. It consist of an home-made white-light interferance microscope operating in the vertical scanning mode, integrated into a commercial Atomic Force Microscope. The performance in [...]
New Developments in Spectroscopic Ellipsometry for Nano Sciences
Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface [...]
Novel Ion Beam Tools for Nanofabrication
Ji Q., Jia L., Jianga X., Jianga X., Jia L., Jianga X., Chena Y., van der Akker B., Leung K.-N., Lawrence Berkeley National Laboratory, US
The drive towards controlling materials properties at nanometer length scales relies on the availability of efficient tools. Ion beams have played a significant role in nanoscience and technology both in material modification (e. g., ion [...]
MEMS/NEMS Dynamics Measurement Tool Using The Stroboscopic Principle
Recently, the rapid growth of micro- and nano-electromechanical systems (MEMS/NEMS) boosts the demands of advanced diagnostic tools and characterization techniques. One of the most critical demands is the high-resolution tools for measuring MEMS/NEMS dynamic behaviors, [...]
Comparative Study of Fabrication Patterns of a Ferroelectric Polymer P(VDF-TrFE) on Gold Thin Film and Gold Ball via Dip-pen Nanolithography
An AFM-based nanolithography, dip-pen nanolithography is becoming a promising nanotechnology since its invention.However, there exists much uncertaintied in DPN process.Much research work are required to do in order to make it as a competitive nanolithography [...]
Theoretical and Experimental Study of Synthetic MFM Tips
Recently, we have developed a synthetic MFM tip consisting of two ferromagnetic layers and a non-magnetic spacer [1]. The two ferromagnetic layers are coupled antiferromagnetically so that the MFM works in a differential detection mode. [...]
Atomic Force Microscope as a Tool for Nanometer Scale Surface Patterning
The progress in scanning probe microscopy (SPM) has transformed scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) from measuring devices into technological tools. Local surface modification by scanning probe allows us to treat materials [...]
High Resolution Mapping of Compositional Differences at Electrode Interfaces by Electric Force Microscopy
Benzyl mercaptan-derived monolayers (X-C6H4-CH2-SH) with various substituents are interrogated on a smooth gold substrate by Electric Force Microscopy. Plots of phase shift vs. dc bias voltage are presented. The basis for the expected two-dimensional phase [...]
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Industry sector: Advanced Materials & Manufacturing
Topic: Materials Characterization & Imaging
ISBN: 0-9767985-1-4