Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal

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Silicon nanowires have attracted significant attention by the electronics industry due to the need for ever-smaller electronics components and devices. It has been shown that nanostructures reveal mechanical and electrical properties that are significantly different [...]

Development of a metrological scanning probe microscope as a primary standard for nanoscale dimensional measurement

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The capability for accurate dimensional measurement at the nanoscale, traceable to the SI meter, is fundamental for the development and effective support of nanoscience and nanotechnology. At the National Measurement Institute Australia (NMIA), the primary [...]