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HomeTopicsCompact Modeling

Topic: Compact Modeling

Antiphase Design for Balanced Oscillators

Liu X., Sheng Z., Law C.L., Qian C., Sun Z., Nanyang Technological University, SG
A novel general design method, which is based on S-parameters and suitable for MMIC and MEMS, has been developed for antiphase balanced oscillators in this paper. To demostrate the design method, a new type of [...]

A New Compact Model of Floating Gate Non-Volatile Memory Cells

Larcher L., Pavan P., Gattel F., Albani L., Marmiroli A., Università di Modena e Reggio Emilia, IT
This paper presents a new compact model of Floating Gate Non-Volatile Memory Cells using SPICE circuit elements. It features many advantages compared to previous models: it is simple and easy to implement and to update, [...]

Compact Modeling and Circuit Impact of a Novel Frequency Dependence of Capacitance in RF MOSFETs

Sudhama C., Joardar K., Whitfield J., Zlotnicka A., Motorola SPS, US
The exploration and modeling of high-frequency MOSFET phenomena are vitally important because MOSFETs are emerging as candidates for active devices in front-end RF circuits operating at more than 1GHz [1-2]. In this work we present [...]

Compact Modeling of Avalanche Breakdown in pn-Junctions for Computer-Aided ESD Design (CAD for ESD)

Subramanian Y., Darling R.B., University of Washington, US
This paper presents and validates compact, physically-based electrothermal models of the avalanche process in pn junctions for use in network simulators (e.g. Saber). Self-heating effects are also included. This enables the simulation of large systems [...]

Experimental Determination of Electrical, Metallurgical, and Physical Gate Lengths of Submicron MOSFET’s

Zhou X., Lim K.Y., Nanyang Technological University, SG
A simple, empirically-based method is developed for extraction of submicron surface-channel MOSFET’s effective channel length (Leff) with critical-dimension correction to poly-gate length (Lg) and correlation to metallurgical channel length (Lmet). A self-consistent compact model for [...]

Using Pseudo Transient Continuation and the Finite Element Method to Solve the Nonlinear Poisson-Boltzmann Equation

Shestakov A.I., Milovich J.L., Noy A., Lawrence Livermore National Laboratory, US
The nonlinear Poisson-Boltzmann (PB) eequation is solved using Pseudo Transient Continuation. The PB solver is constructed by modifying the nonlinear diffusion modeule of a 3D, massively parallel, unstructured grid, finite element, radiation-hydrodynamics code. The solver [...]

Using Scalar Algebraic Multigrid Solvers for Efficient 3-D Stress Analysis of Microfabricated Structures

Mijalkovic S., Delft University of Technology, NL
A methodology to improve the performance of iterative solvers in 3-D stress analysis using scalar algebraic multigrid (AMG) solvers has been presented. The principle idea is to split the global system of coupled stress governing [...]

New Numerical Techniques and Tools in SUGAR for 3D MEMS Simulation

Bai Z., Bindel D., Clark J., Demmel J., Pister K., Zhou N., University of California Davis, US
SUGAR is a modified nodal analysis package for 3D MEMS simulations that owes its heritage and its name to the SPICE family of circuit simulation. SUGAR has undergone the stage of proof-of-concept which showed that [...]

Compact Modeling and Model Order Reduction

Mobility Degradation and Current Loss Due to Vertical Electric Field in Channel Area of Submicron MOS Devices

Keshavarz A.A., Walters J.L., Sampson R., STMicrolectronics, US
In this work we show quantified modeling results for the effect of gate-voltage-induced mobility degradation on MOS device current. Presented results are for three technologies, i.e. 0.50 mm, 0.35mm, and 0.25mm, and are based on [...]

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