noise – TechConnect Briefs

Time-Domain Monte-Carlo and Noise Analysis of MAPS Sensors

Jankowski M., Napieralski A., Lodz University of Technology, PL

A non-typical approach to extended simulational analysis for monolithic active pixel (MAPS) based binary pixel readout circuits is presented. Circuit solutions and simulation results are presented and discussed. Applications of particle detection/tracking are quite wide, [...]

Low frequencies anomalies in GaAs FETs

Iqbal M.A., University of the Punjab, PK

The activation energy and capture cross section of the traps founds in GaAs field Effect transistors (GaAs FETS) have been measured both in ohmic and saturation region. A variety of transients found using frequency dispersion, [...]

Compact Modeling of Noise in non-uniform channel MOSFET

Roy A.S., Enz C.C., Lim T.C., Danneville F., CSEM & EPFL, CH

Compact MOSFET noise models are mostly based on the Klaassen-Prins (KP) method. However, the noise properties of lateral nonuniform MOSFETs are considerably different from the prediction obtained with the conventional KP based methods which, at [...]

Single Election Trapping in Nanoscale Transistors; RTS(Random Telegraph Signals) and l/f Noise

Forbes L., Miller D.A., Louie M.Y., Oregon State University, US

Random telegraph signal, RTS, noise[1] is most obvious in submicron devices with traps, for example in nanoscale MOS transistors, MOSFET’s, with a low number of carriers. RTS is sometimes an indicator of poor device quality [...]

A charge based compact flicker noise model including short channel effects

Roy A.S., Enz C.C., EPFL, CH

The low-frequency (LF) noise in MOS devices has been the subject of intensive research during past years. It is becoming a major concern for scaled devices because the LF noise increases as the inverse of [...]

Noise-Differential Based Detection of Cells on a Microelectronic Sensor/Actuator Array

Manaresi N., Lanzetta F., Romani A., Medoro G., Guerrieri R., Silicon Biosystems spa, IT

We present a new method to count cells on a microelectonic lab-on-a-chip integrating an array of Dielectrophoretic (DEP) cages and embedded optical sensors. Cells are trapped by DEP cages above photodiodes measuring the optical near [...]

1/f Noise and RTS(Random Telegraph Signals) and Read Errors in Nanoscale Memories

Forbes L., Miller D.A., Louie M.Y., Oregon State University, US

The use of charge storage on nanoscale particles has been realized in silicon integrated circuit memories [1,2] and utilized in commercial products[2]. An analysis has previously been made of the increasing portion of the threshold [...]

Charge-Based Formulation of Thermal Noise in Short-Channel MOS Transistors

Paim V.C., Galup-Montoro C., Schneider M.C., Federal University of Santa Catarina, BR

In this communication we present a charge-based formulation for the thermal noise in short-channel MOS transistors. We arrive at a closed expression for the channel noise including velocity saturation for all the operating regions of [...]

Investigation of Substrate Current Effects and Modeling of Substrate Resistance Network for RFCMOS

Lee J.C., Anna R.B., Sweeney S.L., Pan L.H., Newton K.M., IBM Corporation, US

RF device models focus on device performance in the high frequency region, with a reasonable DC model. The substrate current (Isub) is often regarded as unimportant in the DC model and thus ignored because the [...]

BSIM Model for MOSFET Flicker Noise Statistics: Technology Scaling, Area, and Bias Dependence

Ertürk M., Anna R., Newton K.M., Xia T., Clark W.F., IBM Systems and Technology Group, US

We have implemented a statistical model for MOSFET flicker noise as an extension to BSIM. Model development methodology and hardware correlation for various types of MOSFETs from 180nm and 130nm technology nodes are presented. Given [...]