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Elements for Modeling Diffused Piezoresistor Temperature Coefficient and Sensitivity

Mladenovic D., Hutchins J., Tran E., Lu S., Motorola, US

This article reviews elements needed to be considered in order to improve accuracy of the temperature coefficient and sensitivity (span) simulation for diffused piezoresistors. Modeling is done through an algorithm developed in 'Mathematica'. Input parameters [...]

Reliability Issues in Microelectromechanical Systems

Avula X.J.R., University of Missouri-Rolla, US

The interdisciplinary field of micro-electro-mechanical systems (MEMS) has emerged as a dominant field with potential for the development of commercially viable products such as sensors and actuators, automotive and aerospace electronics, computer peripherals, communication devices, [...]

Yield Prediction Under Non-Standard Data Distributions

Rao S., Saxena S., Apte P., Mozumder P.K., Davis J., Burch R., Vasanth K., Texas Instruments, Inc., US

The trend towards smaller feature sizes has increased the need to accurately characterize the distribution of process and device responses to predict and improve yield [1]. The usual approach to characterization assumes that the response [...]

A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures

Iverson R.B., LeCoz Y.L., Random Logic Corporation, US

The floating random-walk method has been used to efficiently extract interconnect capacitance in complex, multilevel integrated circuits. We present here an overview of the floating random-walk method in the context of capacitance extraction. The method [...]

Fault Model Generation for MEMS

Kolpekwar A., Kellen C, Blanton R.D., Carnegie Mellon University, US

Most MEMS applications demand extraordinary levels of product reliability. This results in the need to design a comprehensive testing methodology for MEMS. Effectiveness of any testing methodology depends on the accuracy of fault models utilized. [...]

Country: US

Elements for Modeling Diffused Piezoresistor Temperature Coefficient and Sensitivity

Reliability Issues in Microelectromechanical Systems

Yield Prediction Under Non-Standard Data Distributions

A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures

Fault Model Generation for MEMS

Adaptive Hierarchical Finite Element Modeling of Dopant Diffusion

Modeling of Strain in Boron-Doped Silicon Cantilevers

Residual Stresses/Strains Analysis of MEMS

PSDesigner: A Framework for Transistor Co-Optimization

Numerical Simulation for the Sacrificial Release of MEMS Square Diaphragms