Local Electrode Atom Probes for 3-D Metrology

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Imago Scientific Instruments is developing its Local Electrode Atom Probe (LEAP) microscope for use in semiconductor, data storage, and other nanotechnology industries to provide 3-D atomic-scale metrology. The LEAP microscope achieves true 3-D atomic-scale analysis [...]

A New Semiconductor-Wafer Market Based on the Deepening of Surface Undulations to Form Strongly Textured Atomic Ridges (STAR) With Pitches from 0.6 to 5.4 nm: Model Demonstrations in Electronics and the Physical and Life Sciences

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A broad patent position has been established that produces semiconductor wafers containing physically-deepened grooves, ridges and quantum-dots on particular crystal planes with perfectly spaced pitches of 0.9 to 5.4 nm determined by the inherent crystal [...]