Modeling & Simulation of Microsystems – Page 11

DOE Optimization and Phase Morphology of Electrospun Nanofibers of PANI/PMMA Blends

Desai K., Sung C., University of Massachusetts-Lowell, US

Electrospinning is a process by which sub-micron polymer fibers can be produced using an electrostatically driven jet of polymer solution. The fibers are collected as a non-woven mat or membrane with high surface area to [...]

Uniform Polycarbonate Nanofibers Produced By Electrospinning

Kattamuri N., Sung C., University of Massachusetts, US

In the present work electrospinning of polycarbonate has been performed to produce nanofibers.Parameters like concentration,voltage,flow rate and distances were varied and an optimum condition of all the parameters was achieved to generate uniform ,smooth nanofibers [...]

MEMS Resonator Tuning using Focused Ion Beam Platinum Deposition

Enderling S., Jiang L., Ross A.W.S., Bond S., Hedley J., Harris A.J., Burdess J.S., Cheung R., Zorman C.A., Mehregany M., Walton A.J., University of Edinburgh, UK

This paper presents a novel post-fabrication tuning method which changes the resonant frequency of micromechanical beam resonators using Focused Ion Beam (FIB) deposition and removal of platinum. Tuning was achieved by depositing platinum on a [...]

Elasto-plastic Properties of Electroplated and Polycrystalline Nickel using Numerical Modelling of the Nanoindentation Test Coupled with an Inverse Method

Qasmi M., Delobelle P., Richard F., Université de Franche-Comté, FR

The aim of this paper is a wide investigation of the nano scale of the elastoplastic properties of electroplated Nickel, which is extensively used in the LIGA techniques and polycrystalline hardened and annealed Nickel with [...]

Burned Metal Phenomenon: A Study of Critical Factors and Their Effects on IC Devices during Parallel Lapping

Batteate P., Liao J.Y., Nvidia, US

Parallel lapping is widely employed in destructive physical analysis on semiconductor integrated circuits, to reveal defects isolated by electrical failure analysis tools and techniques. A clean sample surface is critical so that the analysts can [...]

Atomic-scale Structure of Nanocrystals by the Atomic Pair Distribution Function Technique

Petkov V., Central Michigan University, US

Knowledge of the atomic-scale structure is an important prerequisite to understand and control the properties of materials. In the case of crystals it is obtained solely from the Bragg peaks in their diffraction pattern and [...]

Characterization and Parameter Extraction

System-Level Optical Interface Modeling for Microsystems

Kurzweg T.P., Sharma A.S, Bhat S.K., Levitan S.P., Chiarulli D.M., Drexel University, US

In this paper, we present an accurate and computationally efficient system-level optical propagation technique suitable for the modeling of optical interfaces. Our technique is based on extensions to the angular spectrum technique used to solve [...]

Mixed-Domain Simulation of Step-Functional Voltammetry with an Insoluble Species for Optimization of Chemical Microsystems

Martin S.M., Strong T.D., Gebara F.H., Brown R.B., University of Michigan, US

Microinstruments with integrated sensors and electronics are well adapted for remote environmental monitoring applications. Optimization of these microinstruments, however, has been difficult due to a previous lack of mixed-domain simulation environments. This work presents a [...]

A Full-System Dynamic Model for Complex MEMS Structures

Rocha L.A., Cretu E., Wollfenbuttel R.F., Delft University of Technology, NL

For full characterization of a surface micromachined MEMS device, where the thickness of the moving layer is just a few times the gap size, the modeling has to take large-signal behavior and end effects into [...]