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HomeKeywordsscalability

Keywords: scalability

Environmental impact and Scalability of utilizing Coal Fired Power Plant Flue Gas in Microalgal Biofuel Production

Hess D., Napan K., McNeil B., Quinn J.C., Utah State University, US
Large scale biodiesel production from microalgae is expected to be integrated with point source CO2 sources, such as coal fired power plants. Flue gas integration represents a required nutrient source for growth while concurrently providing [...]

Compare and Contrast HiSIM-LDMOS and BSIM based compact model of High Voltage MOSFETs for Analog Applications

Young A., Hall J., Luo Z., Xiao Y., Connerney D., Fairchild Semiconductor, US
A pair of scalable spectre models, one utilizes the Surface Potential based HiSIM-LDMOS model, and the other, the conventional Vth-based BSIM3v3 model, were extracted based on a test vehicle designed with both Drain-Extended CMOS and [...]

A Technology-based Compact Model for Predictive Deep-Submicron MOSFET Modeling and Characterization

Zhou X., Chiah S.B., Lim K.Y., Nanyang Technological University, SG
This paper presents new development results of our compact model (Xsim) for deep-submicron MOSFETs. Although a threshold-voltage-based and source-referenced regional model, Xsim meets the basic requirements of continuity (to third-order derivatives), scalability (entire geometry range), [...]

Translating the Integration Challenges to Molecular Device Requirements – Analysis of Scaling Constraints in Molecular Random Access Memories

Amsinck C.J., Di Spigna N.H., Nackashi D.P., Franzon P.D., North Carolina State University, US
Integrating molecular memory devices into large scale arrays is a key requirement for translating the miniature size of molecular devices into ultradense memory systems. This in turn imposes constraints on the individual molecular memory devices. [...]

A Technology-based Compact Model for Predictive Deep-Submicron MOSFET Modeling and Characterization

Zhou X., Chiah S.B., Lim K.Y., Nanyang Technological University, SG
This paper presents new development results of our compact model (Xsim) for deep-submicron MOSFETs. Although a threshold-voltage-based and source-referenced regional model, Xsim meets the basic requirements of continuity (to third-order derivatives), scalability (entire geometry range), [...]

Nanocomputer Systems Engineering

Frank M.P., University of Florida, US
Regardless of whichever precise nano-device technology ends up being most viable for general-purpose computing, the design of densely-packed computer systems comprised of nanometer-scale bit-devices offers a number of interesting new challenges for the field of [...]

A Scalable RF Model of the Metal-Oxide-Metal (MOM) Capacitor

Chunqi G., Manh Anh D., Zheng Z., Boyland F., Chartered Semiconductor Manufacturing Ltd., SG
An accurate, scalable RF subcircuit model is presented for Metal-Oxide-Metal (MOM) capacitor. Polynomial equations are used to describe the relation between the value of each subcircuit component and the area of MOM capacitor. The model [...]

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