Application of Multi-frequency Test and Neural Network to Fault Diagnosis in Analog Circuits
Wang C., Wang H., Ye Y., Liang H-L, Wang C., Wang H., Mei J., He J., Chan M., PKU-HKUST Shenzhen-Hongkong Institution, CN
In this paper, the multi-frequency test and neural networks (NNs) are applied to fault diagnosis in analog circuits. The reason is that multi-frequency test can maximize differences between the failure and the normal circuit’s response, [...]