Lee B. – TechConnect Briefs

Quantitative Synchrotron Grazing Incidence X-ray Scattering Analysis of Cylindrical Nanostructure in Supported Thin Films

Heo K., Joo W.-C., Kim J.K., Lee B., Ree M., Yang S.-Y., Yoon J., Pohang University of Science and Technology, KR

Grazing incidence X-ray scattering (GIXS) has emerged as a powerful technique for characterizing internal structure of hin film. The X-ray beam impinges at a grazing angle onto the sample slightly above the critical angle, so [...]

Quantitative Synchrotron Grazing Incidence X-ray Scattering and Reflectivity Analysis of Nano-structures and Patterns Supported with Substrates

Chang T., Choi S.C., Heo K., Hwang Y., Jin K.S., Jin S., Kim G., Kim H., Kim J-S, Kim J., Kim K.W., Lee B., Oh W., Park I., Park Y.H., Ree M., Yoon J., Pohang University of Science & Technology, KR

Single-layer, multi-layer, and patterned nanostructures were fabricated with aids of substrates from various material systems (polymers, diblock copolymers, polymer blends, alumina precursors, silane precursor, etc.) using wet spin-coating and subsequent dry and thermal process, chemical [...]

Mechanics of silicon nanowires: size-dependent elasticity from first principles

Lee B., Rudd R.E., Lawrence Livermore National Laboratory, US

We have conducted a detailed study of the size dependence of the mechanical properties of silicon nanowires using first principles quantum mechanical calculation together with continuum mechanics theory and atomistic simulation based on empirical potentials. [...]