Quantitative Synchrotron Grazing Incidence X-ray Scattering Analysis of Cylindrical Nanostructure in Supported Thin Films
Heo K., Joo W.-C., Kim J.K., Lee B., Ree M., Yang S.-Y., Yoon J., Pohang University of Science and Technology, KR
Grazing incidence X-ray scattering (GIXS) has emerged as a powerful technique for characterizing internal structure of hin film. The X-ray beam impinges at a grazing angle onto the sample slightly above the critical angle, so [...]