Quantitative Synchrotron Grazing Incidence X-ray Scattering Analysis of Cylindrical Nanostructure in Supported Thin Films

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Grazing incidence X-ray scattering (GIXS) has emerged as a powerful technique for characterizing internal structure of hin film. The X-ray beam impinges at a grazing angle onto the sample slightly above the critical angle, so that the film is still fully penetrated by Xray. Analytical solutions of GIXS atterns based on the distorted wave Born approximation have been developed to describe the complicated reflection and fraction effects, which are not found in conventional transmission X-ray scattering. Here, we attempted the quantitative analysis of the two-dimensional (2D) GIXS patterns of polystyrene-b-polymethylmethacrylate (PS-b-PMMA) diblock copolymer films deposited on silicon substrates. The analysis of the GIXS patterns with using the GIXS theory was successfully carried out

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Journal: TechConnect Briefs
Volume: 4, Technical Proceedings of the 2007 NSTI Nanotechnology Conference and Trade Show, Volume 4
Published: May 20, 2007
Pages: 113 - 115
Industry sector: Advanced Materials & Manufacturing
Topics: Materials Characterization & Imaging
ISBN: 1-4200-6376-6