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HomeAuthorsEnz C.

Authors: Enz C.

A Basic Property of MOS Transistors and its Circuit Implications

Vittoz E., Enz C., Krummenacher F., Swiss Center for Electronics & Microtechnology, CH
The MOS transistor drain current is the (linear) superposition of independent and symmetrical effects of source and drain voltages. This basic property is not affected by the geometry or symmetry of the transistor, by the [...]

Advanced Compact Models for MOSFETs

Watts J., McAndrew C., Enz C., Galup-Montoro C., Gildenblat G., Hu C., van Langevelde R., Miura-Mattausch M., Rios R., Sah C-T, Joint Paper, US
The combination of decreasing MOSFET dimensions and increasing use of MOSFETs for analog and RF application has created the need for advanced compact models for MOSFET circuit design. The first generation of MOSFET models rely [...]

A Basic Property of MOS Transistors and its Circuit Implications

Vittoz E., Enz C., Krummenacher F., Swiss Center for Electronics & Microtechnology, CH
The MOS transistor drain current is the (linear) superposition of independent and symmetrical effects of source and drain voltages. This basic property is not affected by the geometry or symmetry of the transistor, by the [...]

The EKV 3.0 Compact MOS Transistor Model: Accounting for Deep-Submicron Aspects

Bucher M., Enz C., Krummenacher F., Sallese J.M., Lallement C., Porret A.S., National Technical University of Athens, GR
The EKV 3.0 compact MOS transistor model for advanced IC design is presented. Its basis is an ideal analytical charge-based model including static to non-quasistatic dynamic aspects and noise. The ideal model is extended to [...]

The Foundations of the EKV MOS Transistor Charge-Based Model

Enz C., Bucher M., Porret A.S., Sallese J.M., Krummenacher F., Swiss Center for Electronics and Microtechnology, CH
This paper presents the foundations that lead to the EKV MOS transistor compact model. It describes all the basic concepts required to derive the large-signal and smallsignal charge-based model that is valid in all modes [...]

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