FR – Page 25 – TechConnect Briefs

High Damping Electrostatic System For Vibration Energy Scavenging

Despesse G., Chaillout J.J., Dekkaki I., Jager T., Léger J.M., Vassilev A., Basrour S., Charlot B., CEA-LETI, FR

We report here global simulations and designs of mechanical structures able to recover power over a large spectrum below 100 Hz. Contrary to existing structures tuned on a particular frequency, we have investigated conversion structures [...]

Application of MCLC Method for Estimating the Parameters of MEMS Sensors

Colinet E., Juillard J., Nicu L., SUPELEC, FR

An original method for estimating the parameters of MEMS sensors is presented. It is based on the measurement of binary oscillations appearing at the system's output when a discrete-time relay feedback is used: the parameters [...]

Electronic Properties of Gaphitic Surfaces with Adsorbed Aromatic Amino Acids

Roman C., Ciontu F., Courtois B., Tima Laboratory, FR

The electronic properties of aromatic amino acids physisorbed on graphene are investigated in view of establishing if carbon nanotube transconductance sensors can respond to this type of chemical stimuli. Several conclusions are drawn regarding both [...]

Low Field Electron Mobility in Ultra-Thin Strained-Si Directly on Insulator MOSFET in Sub-0.1µm Regime

Amtablian S., Barraud S., CEA-DRT/LETI, FR

A 200 word (or less) text only summThe fabrication of Fully-Depleted strained-Si directly on insulator (SSOI) MOSFET was recently demonstrated. The combination of strain-induced transport property with the scaling advantage of ultra-thin body devices is [...]

NanoSPRINT: Intelligent Innovation Tools

Ciontu F., NanoSPRINT, FR

This paper outlines the trends motivating the NanoSPRINT project: using recent advances in knowledge engineering to provide a new generation of tools for nanotechnology foresight. Today, the foresight paradigm must cope with new challenges emerging [...]

New Developments in Spectroscopic Ellipsometry for Nano Sciences

Piel J.-P., Darragon A., Defranoux C., SOPRA-SA, FR

Spectroscopic Ellipsometry (SE) is an optical technique, non destructive, to characterize the complex reflectivity of surfaces and layers from the deep UV (190nm) to the mid InfraRed (20µ). SE does not need any reference surface [...]

Hydrodynamically Driven Self-Assembly of Block Copolymers Studied by On-Line Small Angle X-Ray Scattering

Panine P., European Synchrotron Radiation Facility E.S.R.F., FR

A new technique of controlling the supramolecular structure of block copolymer solutions is presented. It consists in monitoring by small angle x-ray scattering the large-scale structure of soft condensed matter and simultaneously recording its rheological [...]

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