Papers – Page 37 – TechConnect Briefs

Layer-by-layer Nano-assembled Polypyrrole Humidity Sensor

Nohria R., Khillan R.K., Su Y., Lvov Y., Varahramyan K., Louisiana Tech University, US

In recent years the influence of humidity has been given top priority in moisture sensitive areas such as high voltage engineering systems, storage areas, computer rooms etc. Conducting or semiconducting conjugated polymers show significant change [...]

Bio-assembly of Nanoparticles for Device Applications

Singh K.V., Alim K., Wang X., Balandin A., Ozkan C.S., Ozkan M., Ozkan C.S., Ozkan M., UC-Riverside, US

Due to limitations of current lithographic methods, for future electronic device fabrication especially below 10 nm various methods are currently being investigated. To this end, in my research group, we assemble nanometer size particles with [...]

NEMS Mass Sensor by Focused Ion Beam Fabrication

Boonliang B., Prewett P.D., Ward M.C.L., Docker P.T., Birmingham University, UK

Due to rising industrial demands (food, biology, control), there is a drive to develop smaller, more sensitive sensor-devices with real-time capability. The objective of this work is to utilise Focused Ion Beam (FIB) fabrication technology [...]

Reflow Microfabrication for Refractive Optical Components: Process and Materials

Johnstone R.W., Parameswaran M., Simon Fraser University, CA

Our paper will describe a new method of fabricating refractive optical components for free-space micro-optical systems. The seminal paper on this topic was Pister et al [1], in which hinges were used to demonstrate several [...]

In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection

Wu C-L, Tseng F-G, Chieng C-C, National Tsing Hua University, TW

We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.

Surface Reactions of Linear Atomic Metal Wire Complexes

Lung C-H, Chang C-C, National Taiwan University, TW

The communication among nanostructures and between these structures and the outside world becomes very critical as the key features in electronics devices continue to shrink in the double-digit nanometer regime. To explore the possible formation [...]

Nanocharacterization Using Secondary Ion Mass Spectrometry (SIMS)

Novak S.W., Magee C.W., Evans East - Evans Analytical Group, US

Secondary Ion Mass Spectrometry (SIMS) has been widely applied for depth profile analysis in the semiconductor industry, but less widely applied to characterization of other materials. Evans East has developed techniques over the last few [...]

Optical Characterization of the Au Nanoparticle Monolayer on Silicon Wafer

Wang D-S, Chuang L., Lin C-W, National Taiwan University, TW

In recent years, self-assembly technique has been widely used in fabricating Au nanoparticle layer. It has drawn a lot of attentions owing to its promising application in biosensing.However, to date there have been very few [...]

SPM Investigation of the Electron Properties YSZ Nanostructured Films

Antonov D.A., Gorshkov O.N., Kasatkin A.P., Maximov G.A., Saveliev D.A., Filatov D.O., University of Nizhny Novgorod, RU

In present work, the electron properties of YSZ nanostructured films using combined Atomic Force Microscopy / Òunnel Spectroscopy (AFMTS) have been investigated.It was demonstrated, the implantation of the films ZrO2(Y) by zirconium ions reduced forming [...]

Preparation of PZT nanodots on Nano-Templated Substrates

McMillen M.J.A., Lookman A., Douglas C, Evans P, Bowman R.M., Gregg J.M., Pollard R.J., Queen's University, Belfast & Nanotec NI, UK

There is considerable interest in creation of nanoscale capacitor arrays. For example, in FeRAM technology, which has great potential, significant capacitor cell size reduction and transition to 3D structures, can be achieved within existing CMOS [...]