In-situ Study of SAMs Growth Process by Cross Analysis of AFM Height and Lateral Deflection

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We set a model for analysis the AFM image, by cross analysis multiple channel, we can investigate more nano scale information on surafce property.

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Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2005 NSTI Nanotechnology Conference and Trade Show, Volume 2
Published: May 8, 2005
Pages: 408 - 411
Industry sector: Advanced Materials & Manufacturing
Topicss: Advanced Materials for Engineering Applications, Coatings, Surfaces & Membranes
ISBN: 0-9767985-1-4