Materials Characterization & Imaging – Page 60

The Analysis of Coatings Produced by Accelerated Nanoparticles

Kean A.H., Allers L., Mantis Deposition Ltd, UK

This paper describes the generation of nanoparticles of diameter 1-20nm by ‘terminated gas condensation’. The resulting nanoparticles are charged and can be mass selected by a linear quadrupole. The nanoparticles are deposited onto substrates using [...]

Synthesis silica sphere and core-shell Gd2O3:Eu3+@SiO2 phosphor nanoparticles by sol-gel method

Lin C.C., Lin K.M., Lin C.C., Lin K.M., Li Y.Y., Lin C.C., Lin K.M., National Chung Cheng University, TW

The welldispers and nano-scale of silica sphere were synthesized through sol-gel process by TEOS as the precursor at room temperature. We also can control sphere size with the diameter 60 nm, 180 nm and 300 [...]

Lattice Fringe Fingerprinting in Two Dimensions with Database Support

Moeck P., Seipel B., Bjorge R., Fraundorf P., Portland State University, US

Direct space high-resolution phase-contrast transmission electron microscopy (HRTEM) and atomic resolution Z-contrast scanning TEM (Z-STEM), when combined with tools for image-based nanocrystallography possess the capacity to derive the crystallographic phase and shape of nanocrystals. This [...]

An Introduction to Helium Ion Microscopy and its Nanotechnology Applications

Notte J.A., Farkas L., Hill R., Ward B., ALIS Corporation, US

A new imaging technology based on a scanning helium ion beam has been realized. This technology has several advantages over the traditional SEM. Due to the very high source brightness, and the shorter wavelength of [...]

Laser Postionization Secondary Neutral Mass Spectrometry for Analysis on the Nanometer-Scale

Veryovkin I.V., Calaway W.F., Tripa C.E., Pellin M.J., Argonne National Laboratory, US

A new time-of-flight mass spectometer of postionized secondary neutrals, SARISA, has been developed and constructed at Argonne National Laboratory. This advanced analytical instrument has uniquely high useful yield >20%, is equipped with high spatial resolution [...]

NanoDAC/fibDAC – Nanodeformation Measurement Techniques for Reliability Analysis of MEMS and NEMS

Keller J., Vogel D., Michel B., Fraunhofer Institute for Reliability and Microintegration (IZM), DE

Recent advances in microtechnology and the development of new electronics and micro/nanosystem devices in automotive industry, communication sector and life science have led to a strong need in material characterization on the micro and nano [...]

Characterization

High Resolution Mapping of Compositional Differences at Electrode Interfaces by Electric Force Microscopy

Edwards G.A., Driskell J.D., Bergren A.J., Lipert R.J., Porter M.D., Ames Laboratory - U.S. DOE, US

Benzyl mercaptan-derived monolayers (X-C6H4-CH2-SH) with various substituents are interrogated on a smooth gold substrate by Electric Force Microscopy. Plots of phase shift vs. dc bias voltage are presented. The basis for the expected two-dimensional phase [...]

Atomic Force Microscope as a Tool for Nanometer Scale Surface Patterning

Lemeshko S.V., Saunin S.A., Shevyakov V.A., Nanotechnology Instruments Europe B.V., NL

The progress in scanning probe microscopy (SPM) has transformed scanning tunneling microscopes (STMs) and atomic force microscopes (AFMs) from measuring devices into technological tools. Local surface modification by scanning probe allows us to treat materials [...]

Theoretical and Experimental Study of Synthetic MFM Tips

Wu Y.H., Han G., Zheng Y.K., National University of Singapore, SG

Recently, we have developed a synthetic MFM tip consisting of two ferromagnetic layers and a non-magnetic spacer [1]. The two ferromagnetic layers are coupled antiferromagnetically so that the MFM works in a differential detection mode. [...]