Materials Characterization & Imaging – Page 51

In-plane Vibration Measurements of Micro Scale Devices Using Sub-Pixel Image Registration Algorithms and Stroboscopic Illumination

Buyukyazi T., Basdogan I., Koc university, TR

Rapid developments in micro devices created a necessity for reliable testing methods for characterization. There are several methods for vibration measurements but most of them use out-of-plane displacements. However, in most cases in-plane measurements are [...]

Nanometre particle sizing and stability measurement with tabletop PCCS

Laemmle W., Sympatec GmbH, DE

Modern materials very often derive their properties from nano-particles. This implements a fast growing demand for control of particle size in this field. The most popular technique to do so is PCS, photon correlation spectroscopy. [...]

Characterization of Nanaoporous Low-Dielectric Constant SiCOH Films using Organosilane Precursor

Heo K., Park S.-G., Yoon J., Jin K.S., Jin S., Jin K.S., Jin S., Rhee S.W., Ree M., Pohang University of Science and Technology, KR

The grazing incidence small-angle X-ray scattering (GISAXS) and X-ray reflectivity (XR) analysis were performed to investigate the nanoporous structure of low dielectric constant carbon-doped silicon oxide (SiCOH) films, which were deposited with plasma enhanced chemical [...]

Preparation and Characterization of Mn and Co substituted nano particle ZnO

Venugopal Reddy P., Kalyana Lakshmi Y., Raju K., Osmania University, IN

With a view to study the influence of nano size on various physical properties in general and ferromagnetic properties in particular, a series of oxide based diluted magnetic semiconductors were prepared by chemical routes such [...]

Synchrotron X-Ray Scattering Studies of Star-Shape Polymers

Jin K.S., Jin S., Higashihara T., Jin K.S., Jin S., Yoon J., Heo K., Kim J., Kim K.W., Kim J., Kim K.W., Hirao A., Ree M., Pohang University of Science and Technology, KR

The physical properties of well-defined star-shape polystyrenes with high number of arms (6 to 57 arms) in good and theta solvents were studied using synchrotron X-ray scattering. The scattering profiles for multi-armed polystyrenes shown the [...]

Quantitative Synchrotron Grazing Incidence X-ray Scattering Analysis of Cylindrical Nanostructure in Supported Thin Films

Yoon J., Yang S.-Y., Lee B., Joo W.-C., Heo K., Kim J.K., Ree M., Pohang University of Science and Technology, KR

Grazing incidence X-ray scattering (GIXS) has emerged as a powerful technique for characterizing internal structure of hin film. The X-ray beam impinges at a grazing angle onto the sample slightly above the critical angle, so [...]

Real-Time In-Situ Measurement of Nanoparticle Size Distributions Using Electrical Mobility Technique

Singh M., Kathleen E., Osmondson B., TSI Incorporated, US

Electrical Mobility Technique for real-time sizing of aerosolized nanoparticles is described. Case studies of measurement of nanoparticles using electrical mobility and comparison of results with Scanning Electron Microscopy are shown.

Structural Analysis of Ptx-Pd1-x Nanoparticles Supported on amorphous Silica by High Resolution Electron Microscopy

Castillo N., Diaz Barriga L., Pérez R., UNAM, MX

Bimetallic nanoparticles structures and properties are distinct from those of pure elemental clusters. Particularly nanoalloy clusters finely dispersed onto high surface area supports, play an important role in heterogeneous catalysis because the performance of a [...]

TEM Studies of Iron Oxide Nanoparticles for Cell Labeling and Magnetic Separation

Koh A.L., Sinclair R., Stanford University, US

One of the application areas for magnetic nanoparticles (MNPs) is in cell labeling and magnetic separation. This process involves tagging MNPs onto desired cells and then separating them from unwanted entities using a sensor which [...]

Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling

Jenke M.G., Santschi Ch., Hoffmann P., EPFL (Ecole Polytechnique Fédérale de Lausanne), CH

The fabrication and characterisation of interdigitated titanium nanoelectrode arrays with 500nm and 50nm width and spacing is described in this work. The electrical-field above the fabricated 500nm electrodes can be sensed by means of a [...]