Sensors, MEMS, Electronics – Page 411

A Least Squares Algorithm for Optimal Heater Placement in Microsensors

Liu C.C., Man P.F., Mastrangelo C.H., University of Michigan, US

In this paper we present an algorithm that yields the optimal placement of a finite number of constant power density heaters for an arbitrary desired temperature profile. Using this algorithm, the volume efficiency (the percentage [...]

Elements for Modeling Diffused Piezoresistor Temperature Coefficient and Sensitivity

Mladenovic D., Hutchins J., Tran E., Lu S., Motorola, US

This article reviews elements needed to be considered in order to improve accuracy of the temperature coefficient and sensitivity (span) simulation for diffused piezoresistors. Modeling is done through an algorithm developed in 'Mathematica'. Input parameters [...]

Reduced Electro-Thermal Models for Integrated Circuits

Furmanczyk M., Napieralski A., Szaniawski K., Tylman W., Lara A., Technical University of Lodz, PL

Power dissipation density in today's integrated circuits makes thermal problems very important. Unfortunately, the electro-thennal co-simulations, which are often indispensable in solving thennal issues, are constrained by the lack of the IC's electro-thermal models. This [...]

Thermo-Mechanical Modeling

Reliability Issues in Microelectromechanical Systems

Avula X.J.R., University of Missouri-Rolla, US

The interdisciplinary field of micro-electro-mechanical systems (MEMS) has emerged as a dominant field with potential for the development of commercially viable products such as sensors and actuators, automotive and aerospace electronics, computer peripherals, communication devices, [...]

Drain and Gate Voltage Influences on MAGFET Offset and Sensitivity: Modeling and Experiment

Ionescu A.M., Mathieu N., Chovet A., LPCS/ENSERG, FR

In this paper both offset and absolute/relative sensitivities of MAGFET (MAGnetic Field Effect Transistor) are investigated as functions of the drain and gate voltages. Accurate physical and analytical models are developed allowing the identification of [...]

Yield Prediction Under Non-Standard Data Distributions

Rao S., Saxena S., Apte P., Mozumder P.K., Davis J., Burch R., Vasanth K., Texas Instruments, Inc., US

The trend towards smaller feature sizes has increased the need to accurately characterize the distribution of process and device responses to predict and improve yield [1]. The usual approach to characterization assumes that the response [...]

A Floating Random-Walk Method for Efficient RC Extraction of Complex IC-Interconnect Structures

Iverson R.B., LeCoz Y.L., Random Logic Corporation, US

The floating random-walk method has been used to efficiently extract interconnect capacitance in complex, multilevel integrated circuits. We present here an overview of the floating random-walk method in the context of capacitance extraction. The method [...]

Fault Model Generation for MEMS

Kolpekwar A., Kellen C, Blanton R.D., Carnegie Mellon University, US

Most MEMS applications demand extraordinary levels of product reliability. This results in the need to design a comprehensive testing methodology for MEMS. Effectiveness of any testing methodology depends on the accuracy of fault models utilized. [...]

3-D Electrothermal Model of Multifinger, High-Power HBTs

Dhondt F., Barrette J., Rolland P.A., Delage S., IEMN, FR

We present a 3-D electrothermal model based on the finite difference method and applied to GaAs heterojunction bipolar transistors (HBTs). This non-linear model compmes the temperature distribution under static bias conditions for multifinger HBTs, although [...]