The Development of Next Generation BSIM for Sub-100nm Mixed-Signal Circuit Simulation

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This paper describes the next generation BSIM model for aggressively scaled CMOS technology. New features in the model include more accurate non-charge-sheet based physics, completely continuous current and derivatives, and extendibility to non-traditional CMOS based devices including SOI and double-gate MOSFETs.

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Journal: TechConnect Briefs
Volume: Technical Proceedings of the 2005 Workshop on Compact Modeling
Published: May 8, 2005
Pages: 233 - 236
Industry sector: Sensors, MEMS, Electronics
Topics: WCM - Compact Modeling
ISBN: 0-9767985-3-0