A Methodology of Field-Emission Modeling with Space-Charge Effects

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In this paper, we present a methodology for modeling and simulating 3D field-emission devices (FED) with space-charge effect. This approach applies a boundary-element-method (BEM) electrostatics solver [1] and an adaptive explicit integrator. The space charge effect is modeled by a method similar to the particle-in-cell (PIC) method [2]. The results by this methodology are verified with the results by a commercial electromagnetic package MAGIC [3]. We also demonstrate that this methodology not only provides excellent accurate results, but also reduces the effort of creating 3D solid models of field emission tips.

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Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
Published: February 23, 2003
Pages: 32 - 35
Industry sector: Sensors, MEMS, Electronics
Topic: Nanoelectronics
ISBN: 0-9728422-1-7