Statistical Models – TechConnect Briefs

Modeling of Mismatch and Across-Chip Variations in Compact Device Models

Lu N., IBM, US

For analog circuit designers, both reducing device mismatch and having a good device mismatch model are very important. Pelgrom characterized device mismatch between two devices separated by a finite distance D as sqrt[a^2/(W*L) + b^2*D^2]. [...]

Modeling of Spatial Correlations in Process, Device, and Circuit Variations

Lu N., IBM, US

We present an innovative method to model the spatial correlations in semiconductor process and device variations or in VLSI circuit variations. Without using the commonly adopted PCA approach, we give a very compact expression to [...]

Modeling MOSFET Process Variation using PSP

Watts J.S., Lee Y.M., Park J-E, IBM, US

The PSP model has been extensively evaluated for it’s abililty accurately match IV and CV characteristics MOSFETs measured on a single die. This enables accurate prediction of circuit behavior for circuits made of transistors which [...]