Shock Testing of Free Standing Silicon-Nitride and Beryllium Membranes
Brough D., Barrett L., Vanfleet R., Davis R., Liddiard S., Cornaby S., Coffin M., Brigham Young University, US
As micro and nanotechnology continue to advice into products, durability, reliability and robustness become important factors. One application where micro technology needs such qualities is X-ray windows. X-ray windows consist of free standing thin film [...]