history – TechConnect Briefs

Modeling of Gate Leakage, Floating Body Effect, and History Effect in 32nm HKMG PD-SOI CMOS

Deng Y., Rupani R.A., Johnson J., Springer S., IBM, US

The gate leakage, floating body effect, and history effect in 32nm HKMG PD-SOI CMOS have been extensively studied and analyzed. Based on the measured data, a comprehensive HKMG PD-SOI gate leakage model has been developed [...]

A History of Electronic Traps on Silicon Surfaces and Interfaces

Sah C-T, Jie B.B., Chen Z., University of Florida, US

A review of the electronic or electron and hole traps on silicon surfaces and interfaces is given. They are increasingly affecting the electrical signal properties of silicon diodes and transistors as the technologies for digital, [...]

A History of MOS Transistor Compact Modeling

Sah C-T, University of Florida, US

The MOSFET (Metal-Oxide-Silicon Field-Effect- Transistor) or MOS Transistor (MOST) is a three dimensional electronic device. It operates on the conductivity modulation principle in a thin semiconductor layer by a controlling electric field to give amplifying [...]

A History of MOS Transistor Compact Modeling

Sah C-T, University of Florida, US

The MOSFET (Metal-Oxide-Silicon Field-Effect- Transistor) or MOS Transistor (MOST) is a three dimensional electronic device. It operates on the conductivity modulation principle in a thin semiconductor layer by a controlling electric field to give amplifying [...]

Predicting the SOI History Effect Using Compact Models

Na M-H, Watts J.S., Nowak E.J., Williams R.Q., Clark W.F., IBM Corporation, US

A simple and effective compact model methodology that predicts the history effect in silicon-on-insulator (SOI) is discussed. In this study we employ three physical parameters to modify the body-potentials of SOI FETs in an inverter [...]