Measuring Resistive Characteristics of Silicon Nanowire by Applying Electrostatic Tensile Device and Broadband Test Signal
Roinila T., Verho J., Vilkko M., Kallio P., Lekkala J., Zeng H., Yu X., Li T., Wang Y., Tampere University of Technology, FI
Silicon nanowires have attracted significant attention by the electronics industry due to the need for ever-smaller electronics components and devices. It has been shown that nanostructures reveal mechanical and electrical properties that are significantly different [...]