On Idlow with Emphasis on Speculative SPICE Modeling
An J.X., Assad F., Chen Q., Goo J-S, Icel A.B., Krishnan S., Ly T., Radwin M., Subba N., Suryagandh S., Thuruthiyil C., Wu Z-Y, Yonemura J., Advanced Micro Devices, US
An empirical correlation model of Idlow, the MOSFET drain current measured at Vgs=Vdd/2 and Vds=Vdd, where Vdd is the supply voltage, is proposed based on the alpha-power law model. It enables a comprehensive analysis of [...]