Assad F., Ren Z., Vasileska D., Datta S., Lundstrom M.S.
Purdue University, US
Keywords: MOS FETS, on-currents
The continued evolution of Si technology hinges to a large extent on the ability to maintain high on-currents while achieving low off-currents. As we move from sub-micron to nanoscale technology, it is not at all clear that these often-contradictory requirements can simultaneously be met. In this talk, we establish ultimate limits for the on-current and compare them against the targets in the National Technology Roadmap for Semiconductors (NTRS). We present a simple theory to predict the on-current of a MOSFET in the limit of no scattering in the critical portion of the device. We show that current devices achieve about one-third of this ballistic limit on-current and that future devices will have to achieve about two-thirds of the ballistic limit in order to meet the NTRS on-current target.
Journal: TechConnect Briefs
Volume: Technical Proceedings of the 1999 International Conference on Modeling and Simulation of Microsystems
Published: April 19, 1999
Pages: 388 - 390
Industry sector: Sensors, MEMS, Electronics
Topics: Modeling & Simulation of Microsystems, Nanoelectronics
ISBN: 0-9666135-4-6