van Langevelde R., Scholten A.J., Tiemeijer L.F., Havens R.J., Klaassen D.B.M.
Philips Research Laboratories, NL
Keywords: compact modeling, distortion, MOS Model 11, noise, non-quasi-static, RF-CMOS, transit time
RF-CMOS applications impose increasingly stringent requirements on compact models used in circuit simulation. In this paper several of these issues will be addressed together with a discussion of the state-of-the-art of compact modelling.
Journal: TechConnect Briefs
Volume: 1, Technical Proceedings of the 2002 International Conference on Modeling and Simulation of Microsystems
Published: April 22, 2002
Pages: 674 - 677
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 0-9708275-7-1