Papers – Page 684 – TechConnect Briefs

Quantitative Synchrotron Grazing Incidence X-ray Scattering Analysis of Cylindrical Nanostructure in Supported Thin Films

Yoon J., Yang S.-Y., Lee B., Joo W.-C., Heo K., Kim J.K., Ree M., Pohang University of Science and Technology, KR

Grazing incidence X-ray scattering (GIXS) has emerged as a powerful technique for characterizing internal structure of hin film. The X-ray beam impinges at a grazing angle onto the sample slightly above the critical angle, so [...]

Real-Time In-Situ Measurement of Nanoparticle Size Distributions Using Electrical Mobility Technique

Singh M., Kathleen E., Osmondson B., TSI Incorporated, US

Electrical Mobility Technique for real-time sizing of aerosolized nanoparticles is described. Case studies of measurement of nanoparticles using electrical mobility and comparison of results with Scanning Electron Microscopy are shown.

Structural Analysis of Ptx-Pd1-x Nanoparticles Supported on amorphous Silica by High Resolution Electron Microscopy

Castillo N., Diaz Barriga L., Pérez R., UNAM, MX

Bimetallic nanoparticles structures and properties are distinct from those of pure elemental clusters. Particularly nanoalloy clusters finely dispersed onto high surface area supports, play an important role in heterogeneous catalysis because the performance of a [...]

TEM Studies of Iron Oxide Nanoparticles for Cell Labeling and Magnetic Separation

Koh A.L., Sinclair R., Stanford University, US

One of the application areas for magnetic nanoparticles (MNPs) is in cell labeling and magnetic separation. This process involves tagging MNPs onto desired cells and then separating them from unwanted entities using a sensor which [...]

Characterisation of Electrical Fields of Buried Interdigitated Nanoscale Ti-Electrode Arrays by a Novel Atomic Force Microscopy Measurement Procedure and Their Fabrication by FIB Milling

Jenke M.G., Santschi Ch., Hoffmann P., EPFL (Ecole Polytechnique Fédérale de Lausanne), CH

The fabrication and characterisation of interdigitated titanium nanoelectrode arrays with 500nm and 50nm width and spacing is described in this work. The electrical-field above the fabricated 500nm electrodes can be sensed by means of a [...]

Image-based Nanocrystallography in Two and Three Dimensions with

Moeck P., Bjorge R., Fraundorf P., Portland State University, US

It is well known that many nanocrystals can not be identified from their powder X-ray diffraction pattern as it is customary for collections of micrometer sized crystals. The crystallographic phase and shape of nanocrystals can, [...]

In-situ Gas Injection-Heating Atomic Resolution TEM for Nanomaterials

Zhang X.F., Hitachi High Technologies America, Inc., US

In-situ gas environmental transmission electron microscopy (TEM) capability has been developed based on a Hitachi 300 kV high-resolution transmission electron microscope (H-9500) combined with a Hitachi gas injection-heating sample holder. This simple but high performance [...]

The Impact of Advanced S/TEM on Atomic-Scale Characterisation and Analysis

Hubert D.H.W., Freitag B., Stokes D.J., FEI Company, NL

As the limits of nanotechnology are expanded ever further, so too must we push back the frontiers of imaging and analysis. The need for tools that can deliver new, ultra-high resolution information is driving the [...]

Accommodation of Characterization Tools

York L., Abbie Gregg, Inc., US

Characterization tools are the cornerstone to nanoscale research including microscopy (TEM, SEM, AFM and Aberration Corrected Electron Microscopy), spectroscopy/spectrometry (NMR, FTIR, Acoustic), and advanced nano mechanical (nano scale manipulations) tools. Characterization tools are highly sensitive [...]

Characterisation of Native-State Soft Matter using ‘Multi-Mode’ Electron Microscopy

Stokes D.J., Baken E., Lich B.H., Hubert D.H.W., FEI Company, NL

Soft condensed matter and complex fluids are of increasing technological significance. It is therefore crucial that we extend the capabilities of conventional solid state imaging and analytical techniques to include the observation of materials such [...]