Papers – Page 636 – TechConnect Briefs

Nanoscale Resolution Deformation Measurements at Crack Tips of Nanostructured Materials and Interface Cracks

Keller J., Vogel D., Gollhardt A., Michel B., Fraunhofer Institute for Reliability and Microintegration, DE

The trend towards the application of nanoparticle filled materials in the aerospace and automotive electronics sectors have led to a strong need in material characterization on the micro and nano scale. In addition MEMS and [...]

Use of Lateral Force Microscopy to Elucidate Cooperativity and Molecular Mobility in Amorphous Polymers and Self-Assembling Molecular Glasses

Knorr Jr. D.B., Killgore J.P., Gray T.O., Overney R.M., University of Washington, US

A novel scanning probe methodology based on lateral force microscopy is presented wherein kinetic friction measurements, obtained as a function of velocity for various temperatures, are used to deduce apparent Arrhenius-type activation energies for surface [...]

Room Temperature Growth of Single Intermetallic Nanostructures on Nanoprobes

Yazdanpanah M.M., Dobrokhotov V.V., Safir A., Pabba S., Rojas D., Cohn R.W., University of Louisville, US

It is possible to grow single crystals directly on nanoprobes, such as atomic force microscope (AFM) probes, tungsten needles and nanotapered glass pipettes. We have grown single Ag2Ga nanoneedles and PtGa6 nanoplates/blades from supersaturated melts [...]

Preparation and characterization of ultrasharp tungsten wires

Kulakov M., Luzinov I., Kornev K., Clemson University, US

The ultrasharp tungsten wires were produced by electrochemical method for electroexplosion of polymers. The effects of electropolishing control parameters, tungsten wire diameter, applied voltage and depth of the wire immersion into electrolyte, on the tip [...]

Measurement of nanometric deformation of thin membranes under controlled mechanical loads

Jobin M., Sidorenko V., Foschia R., Ecole Ingenieurs Geneve, CH

The accurate mechanical characterisation of thin membranes is recognized of prime importance for the development of membrane-based MEMS. To address this issue, we have built a measurement system which uses a nanoindentor to apply a [...]

Mechanical characterization of electrostatic MEMS switches

Souchon F., Koszewski A., Levy D., Charvet PL., CEA/LETI/MINATEC, FR

The paper presents a methodology with nanoindentation experiments to characterize the mechanical properties of MEMS switches. After that, simple analytical models for mechanical and electrostatic aspects are used to validate these mechanical characterizations. At the [...]

Attaching Biological Molecules to AFM Probes for Nanoscale Molecular Recognition Studies

Travis Johnson W., Agilent Technologies, US

Atomic Force Microscopy (AFM) is an important tool for nanoscale molecular recognition studies. A strong suit of AFM is its ability to measure hardness/elasticity, nonspecific adhesion, or ligand-receptor interactions at the picoNewton scale. Molecular interactions [...]

Raman Spectroscopy resolution limits overcome with nanoscale thermal analysis for complete Polymer Blend Characterization

Ye J., Reading K., Kjoller K., Shetty R., Anasys Instruments, US

The goal of this work was to characterize a blend PA6 and PET using a combination of Raman Spectroscopy and AFM techniques. The Raman Microscopy Image revealed the general structure of a PA6 and PET [...]

Guided Self-Assembly of Block-Copolymer Nanostructures

Karim A., Berry B.C., Kim H-C, Kim S., Zhang X., Bosse A.W., Lacerda S.H., Yager K.G., Jones R.L., Douglas J.F., Briber R.M., Kim H-C, Kim S., NIST, US

A primary limitation of block copolymer films as templates for next generation electronic or data storage devices is the prohibitively long times required for thermally driven self-assembly and defect annihilation and long range order development. [...]

Applications Developments with the Helium Ion Microscope

Scipioni L., Notte J., Carl Zeiss SMT, Inc., US

The helium ion microscope is offering new windows into nano-scale imaging. Unique sample interaction dynamics allow new types of sample information to be gathered. Some fundamental advantages conferred by probing a surface with a helium [...]