He J., Xi X., Chan M., Cao K., Niknejad A., Hu C.
University of California-Berkeley, US
Keywords: accumulation layer, capacitance, compact modeling, MOSFET's, surface potential
A Physics-Based Analytical Surface Potential and Capacitance Model of MOSFETs Operation from Strong Accumulation to Depletion region Jin He*+, Xuemei Xi*, Mansun Chan*, and Chenming Hu* (*Electronics Research Laboratory, Department of Electrical Engineering and Computer Sciences, University of California at Berkeley, CA, 94720, USA) (+Institute of Microelectronics, Peking University, Beijing, 100871, P. R. China) e-mail jinhe@eecs.berkeley.edu fax:01-510-643-2636 Abstract A physics-based analytical continuous model of MOSFET surface p potential and capacitance from strong accumulation to depletion is presented and the result is compared with 2-D numerical device simulation. Starting from the Poisson equation, an exact solution of the surface potential from accumulation to depletion is derived. Then, a continuous capacitance expression has been obtained and which gives a good agreement with 2-D device simulation. In addition, the importance of this model is demonstrated in the analysis of harmonic distortion.
Journal: TechConnect Briefs
Volume: 2, Technical Proceedings of the 2003 Nanotechnology Conference and Trade Show, Volume 2
Published: February 23, 2003
Pages: 302 - 305
Industry sector: Sensors, MEMS, Electronics
Topic: Compact Modeling
ISBN: 0-9728422-1-7